Imaging of Electric Fields at the GaN/Ni Interface Using Electron Beam Induced Current in a Scanning Transmission Electron Microscope
2017
Keywords:
- Scanning confocal electron microscopy
- Electron beam-induced current
- Analytical chemistry
- Conventional transmission electron microscope
- Electron beam-induced deposition
- Environmental scanning electron microscope
- Scanning Hall probe microscope
- Materials science
- Electron microscope
- Nuclear magnetic resonance
- Scanning transmission electron microscopy
- Electron tomography
- Optics
- Correction
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