Z-scan and four-wave mixing characterization of semiconductor cadmium chalcogenide nanomaterials

The possible physical origin of third-order nonlinearity of cadmium chalcogenide (Te, Se, and S) semiconductor nanocrystals were discussed based on the results of both Z-scan and degenerate four-wave mixing spectroscopies at 532, 775, 800, and 1064 nm in nanosecond, picosecond, and femtosecond time scale for nonlinear photonic applications.