Index of refraction and its temperature coefficient in CdSe0.18Te0.82 at 10.2 μm wavelength

The index of refraction and its temperature dependence were measured at 10.22 μm on CdSe0.18Te0.82 grown by the Bridgman technique. The results are n=2.67±0.02 (different than the value expected from Vegard’s law), and (1/n)(dn/dt)=(3.89±0.07)10−5 °C−1. The absorption coefficient of the sample has also been measured, α=(0.79±0.05) cm−1.