Refractive indices of ir materials: 10.6-μm ellipsometer measurements

M. E. Pedinoff,Morris Braunstein,Oscar M. Stafsudd

Refractive indices of ir materials: 10.6-μm ellipsometer measurements

1977

M. E. Pedinoff
Morris Braunstein
Oscar M. Stafsudd

10.6-μm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive indices of KCl, CdTe, and ZnSe crystals and for ZnSe and ThF4 films.

Keywords:

Cadmium telluride photovoltaics
Thin film
Ellipsometry
Refractive index
Infrared
Indexation
Optics
Crystal
Physics
Phase (waves)
Optoelectronics
Crystal optics

Correction
Source
Cite
Save
Machine Reading By IdeaReader

References

Citations