Electronic structure, crystallographic, magnetic, and transport characterization of EuMn2 films

We report the formation of EuMn2, in the form of a thin film, grown by the reaction of Eu/Mn multilayers in the solid state phase at 480 K. X-ray diffraction (XRD) studies revealed that the EuMn2 crystallizes in a hexagonal structure, with the P6/mmc space group, and lattice parameters a=0.72 nm and c=1.07 nm. X-ray photoelectron spectroscopy measurements showed divalent europium forming the compound. Transition to a magnetically ordered phase was observed at 15 K. The value of 4πMs was estimated to be 1.5 kG at 2 K. An unusual behavior of the temperature dependence of resistivity was observed in the film, suggesting the presence of valence fluctuation systems.