Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4

Results of x-ray diffraction measurements are presented for ZnCr2O4 and Ni0.5Zn0.5Cr2O4. Splits of the x-ray diffraction spectrum are observed in ZnCr2O4 at 12 K. In Ni0.5Zn0.5Cr2O4 no clear split is observed, but a full width at half maximum (FWHM) shows a steep increase below about 20 K. It is found that the integrated intensity of the diffraction spectra shows a softening behavior at low temperatures in ZnCr2O4.