A soft-error-immune 0.9-ns 1.15-Mb ECL-CMOS SRAM with 30-ps 120 k logic gates and on-chip test circuitry

A soft-error-immune 0.9-ns 1.15-Mb ECL-CMOS SRAM with 30-ps 120 k logic gates has been developed. To provide good testability, reliability, and stability, on-chip test circuitry, a memory-cell test technique, a highly stable current source, and a soft-error-immune memory cell are proposed.