Design and Realization of Charge Measurement System Based on VA32TA5

Semiconductor detector has lots of advantages, such as good resolution, high sensitivity and wide linear range, which make it the most widely used detector in space exploration of X/gamma Ray. Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy. Aiming at these requirements, a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed. This paper gives a detailed introduction of the system's design principle and implementation procedure, and also gives the preliminary results of performance at the end. Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors, e.g. silicon strip detector, CdZnTe detector.