Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2

Abstract Angle dependent X-ray emission spectroscopy (AXES) is introduced as a tool for depth dependent composition analysis. A controlled variation of the information depth is demonstrated by changing the geometry from grazing exit to grazing incidence geometry. First results are presented from Cu(In,Ga)Se 2 (CIGSe)-based polycrystalline thin film solar cell bi-layer components. A mathematical model explains changes in relative intensity due to the absorption and emission behavior of thin CdS and Zn(S,O) cover layers. The fact that the presented data can be modelled by ideal bi-layer structures, provides both, proof of concept in general and the proof of applicability to the relatively rough layered structures based on CIGSe. In bare CIGSe a homogeneous distribution of Cu and Ga is found in a depth range between 22 and 470 nm.