Substrate temperature dependence of feature profile of carbon films on substrate with submicron trenches

2010 
To control deposition profile of carbon films in trenches, we have studied substrate temperature dependence of deposition rate of carbon films and we have realized anisotropic deposition of carbon films in trenches above 250° deposited by CVD plasma of toluene diluted H 2 , in trenches. Here, we report dependence of properties of plasma CVD carbon films on substrate temperature.
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