Efficient Path Selection for Delay Testing Based on Path Clustering

In this paper, we introduce a way of modeling the differences between the calculated delays and the real delays, and propose an efficient path selection method for path delay testing based on the model. Path selection is done by judging which of two paths has the larger real delay by taking into account the ambiguity of calculated delay, caused by imprecise delay modeling as well as process disturbances. In order to make precise judgment under this ambiguity, the delays of only the unshared segments of the two paths are evaluated. This is because the shared segments are presumed to have the same real delays on both paths. The experiments used the delays of gates and interconnects, which were calculated from the layout data of ISCAS85 benchmark circuits using a real cell library. Experimental results show the method selects only about one percent of the paths selected by the most popular method.