The L-shell ionization of Ho and Os induced by electron impact

The electron-induced L-shell X-ray partial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influence of the electrons reflected from the substrate was corrected by using the electron transport bipartition model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.