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An accurate technique for the direct measurement of the base spreading resistance of bipolar transistors
An accurate technique for the direct measurement of the base spreading resistance of bipolar transistors
1991
W. Thomann
S.G. Knorr
Keywords:
Hybrid-pi model
Bipolar transistor biasing
Mathematics
Machine learning
Artificial intelligence
Bipolar junction transistor
Electronic engineering
Frequency domain
Current injection technique
Heterostructure-emitter bipolar transistor
Spreading resistance profiling
Correction
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