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Influence of beam conditions and energy for SEE testing
Influence of beam conditions and energy for SEE testing
2011
Ferlet-Cavrois
Schwank
Liu
Muschitiello
Beutier
Javanainen
Hedlund
Poivey
Zadeh
Harboe-Sorensen
Santin
Nickson
Menicucci
Binois
Peyre
Hoeffgen
Metzger
Schardt
Kettunen
Virtanen
Berger
Piquet
Foy
Zafrani
Truscott
Poizat
Bezerra
Keywords:
Xenon
Power MOSFET
Beam (structure)
Optics
Physics
Static random-access memory
Energy (signal processing)
Shadow mapping
Correction
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