agnetic Crystallite Formation in Go-Cr Thin Films for Perpendicular Recording Media

In order to understand the formation of nano- si= magnetic domains in Co76Cr24 thin films for ultra-high density perpendicular magnetic recording, film thickness and sputtering gas pressures were investigated using a facing target sputtering VTS) apparatus. Investigations of these films showed they were composed of highly oriented hcp crystallites with lower Cr content (CC,) of isolated ferromagnetic areas uniformly distributed in the higher Cc, host paramagnetic matrix. Diameter of the lower Ccr areas in these films was between 3-5 nm. The perpendicular coercivity in the surface region was greater than 2400 Oe. Consequently, this film is considered to be a good candidate for perpendicular magnetic recording densities approating 1000 Kfci (lOGb/inz). Index Tenrts- thm film, Facing Target Sputtering, isolated ferromagnetic areas, host paramagnetic matrix