Consideration of Secondary Electron Emission Effect for Probe Measurement
2012
With increasing electron temperature (Te \gtrsim20 eV), the effect of secondary electron emission caused by electron impact becomes increasingly significant in probe measurements. Taking into consideration the secondary electron emission coefficient, a method of evaluating probe characteristics is presented and its validity was experimentally investigated using two Langmuir probes of tungsten and molybdenum electrodes with different secondary electron emission coefficients.
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