A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni80Fe20/NixFe1-xO thin-film bilayer

In this paper, transmission electron energy loss spectrometry was used to explore the possible origins for an atypical temperature dependent positive exchange bias in a Ni 80 Fe 20 /Ni x Fe 1-x O thin-film when it is zero-field cooled that shows the usual negative exchange bias when it is field cooled.