Real time analysis of diffraction patterns, at extremely low light levels

Abstract By analyzing previous experiments with statistically independents photons, just one concerns the diffraction pattern; it was revealed with photographic technique. The present describes an experiment which produces a diffraction pattern at very low intensity radiation consisting of statistically independent photons. This pattern was revealed in real time by using image intensification. Several photodetection arrangements utilizing image intensifier tubes and image storage devices have been tested and the results presented. This study involved the evaluation of the error probability in photons overlap at any time. The linearity dependence between light intensity and bright pattern diffraction was verified.