Structural investigation of thin films of Ti1−xAlxN ternary nitrides using Ti K-edge X-ray absorption fine structure
2007
Abstract Thin films of Ti 1− x Al x N nitrides were prepared over a large range of composition (0 ≤ x
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
17
References
21
Citations
NaN
KQI