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Direct evaluation ofDCcharacteristic variability inFinFETSRAMCell for32nmnodeandbeyond
Direct evaluation ofDCcharacteristic variability inFinFETSRAMCell for32nmnodeandbeyond
2007
Satoshi Inaba
H. Kawasaki
K. Okano
Takashi Izumida
Atsushi Yagishita
K. Ishimaru
Keywords:
direct evaluation
Data mining
Environmental science
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