Development of Apparatus for Phase Imaging Using X-Ray Interferometers at BL20XU of SPring-8

Phase‐contrast X‐ray imaging, including phase tomography, was performed at the medium‐length beamline BL20XU of SPring‐8, where undulator X rays were available at 245 m from the source point. A crystal X‐ray interferometer and an X‐ray Talbot interferometer with transmission gratings were used to perform different kinds of phase‐contrast imaging. The crystal X‐ray interferometer was devised in that a crystal lamella for beam recombination was thinned down to 40 μm to achieve high‐resolution imaging. A quick fringe‐scanning mechanism was also constructed enabling the phase measurement with a few second and therefore phase tomography with several minutes. The X‐ray Talbot interferometer was studied as a novel and simple method that generated a contrast corresponding to differential phase. Phase tomography was also attained with the X‐ray Talbot interferometer.