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High-resolution XRD investigation of SiGe/Si heterostructures for novel X-ray detectors
High-resolution XRD investigation of SiGe/Si heterostructures for novel X-ray detectors
2016
Ivan Marozau
Fabio Isa
Arik Jung
Giovanni Isella
Hans von Känel
Philippe Niedermann
O. Sereda
Keywords:
Crystallography
Chemistry
Heterojunction
X-ray detector
high resolution
Optoelectronics
Correction
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