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Optical Characterization of Si1-xCx/Si (0.LEQ.x.LEQ.0.014) Semiconductor Alloys.
Optical Characterization of Si1-xCx/Si (0.LEQ.x.LEQ.0.014) Semiconductor Alloys.
1995
Hosun Lee
S. R. Kurtz
Jerrold A. Floro
J. Strane
C. H. Seager
S. R. Lee
E. D. Jones
J. F. Nelson
Thomas Mayer
S. T. Picraux
Keywords:
Analytical chemistry
Photoluminescence
Semiconductor
Molecular physics
Physics
semiconductor alloys
hydrogen passivation
spectroscopic ellipsometry
si substrate
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