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車載MCUにおける-40~170℃動作可能なWrite Disturb問題スクリーニング回路を有する40nm Dual-port、Two-port SRAM (集積回路)
車載MCUにおける-40~170℃動作可能なWrite Disturb問題スクリーニング回路を有する40nm Dual-port、Two-port SRAM (集積回路)
2015
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kouzi sinkyo
Keywords:
Electronic engineering
Microcontroller
Static random-access memory
Computer science
Computer hardware
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