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High Resolution Electron Beam Induced Current Measurements in an Scanning Tunneling Microscope on GaAs-MESFET
High Resolution Electron Beam Induced Current Measurements in an Scanning Tunneling Microscope on GaAs-MESFET
1994
P. Koschinski
V. Dworak
L.J. Balk
Keywords:
Optoelectronics
MESFET
high resolution
Scanning tunneling microscope
Electron beam-induced current
Materials science
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