The performance of an amorphous silicon flat panel for neutron imaging at the PSI NEUTRA facility

Abstract Commonly applied imaging methods in neutron radiography use a CCD camera in conjunction with a scintillator or imaging plates. CCDs and imaging plates have desirable properties concerning resolution, linearity, dynamic range and signal-to-noise ratio ( S / N ) but both techniques have the disadvantage of a slow read out and for the CCD camera, an additional disadvantage is the loss of light through the optical system. Amorphous silicon detectors, originally developed for medical and industrial X-ray imaging, generally do not have the above-mentioned disadvantages. These detectors have a much faster readout and, in comparison to the generally used crystalline silicon, can be put directly in the X-ray or neutron beam without being damaged. This type of detector also does not require any optical interface, minimizing possible light loss. The detector is operated at room temperature, which has some influence on the noise. Using the whole dynamic range with a low gain, results in a S / N of up to 30, for normal applications, however, a S / N of about 15–20 is typical. The main drawback of this imaging device is the dynamic range of only 12 bits and the relatively complicated operating system in which different operation modes can be chosen. In 2003, successful experiments were performed with this new device, but it is still in its fledgling stages and improvements from the manufacturer as well as the experience from the NEUTRA team will help to advance this technique for neutron imaging in a most efficient way.