Molecular secondary ion emission from binary collisions

Abstract Secondary ions, produced by neutral 1.0 MeV argon beam impact on Al 2 O 3 and LiF thin films, are analyzed by a XY-TOF detection system. Angular distributions and initial velocities are simultaneously determined for ionized species originating from the bulk or from the adsorbate layer. The employed XY-TOF spectrometer was designed to measure accurately radial and axial velocity measurements of positive and negative secondary ions with mass