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Trends on multilayer X-ray optics and scatterless pinholes
Trends on multilayer X-ray optics and scatterless pinholes
2015
Jörg Wiesmann
Frank Hertlein
Andreas Kleine
Carsten Michaelsen
Uwe Heidorn
Christopher Umland
M. Störmer
Keywords:
Crystallography
X-ray optics
Chemistry
Optics
Correction
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