The optical properties of the thin film Au/a-Si:H Schottky junction structures

The optical constants, as a surface impedance, of thin-film Au/a-Si:H Schottky junction solar-cell structures were measured using the pseudo-Brewster angle method. The a-Si:H films were deposited on the surface of crystalline Si wafer using tetrode RF sputtering for a pressure ratio of hydrogen to argon gas at 0 to 30%. The thin-film Au/a-Si:H Schottky junction structure was fabricated by vacuum deposition of Au film of 100-AA thickness on the surface of a-Si:H films. The optical constants measured by the pseudo-Brewster angle method compared well with values calculated on the basis of the Fresnel-equation method. >