Variable angle spectroscopic ellipsometry characterization of spin-coated MoS2 films

Abstract Amongst emerging Transition Metal Dichalcogenides (TMDCs), molybdenum disulfide (MoS2) has attracted a remarkable interest thanks to many possible applications. In particular, MoS2 has potentialities not yet fully realized in solution-based applications. However, the lack of knowledge of the optical properties of MoS2 has significantly limited its use in many exciting photonic fields. Films prepared by solution-based exfoliation methods have never been studied to our best knowledge. The optical properties of MoS2 films prepared by solution-based exfoliation methods have never been studied to our best knowledge. Herein, the broadband optical properties of ~20 nm-thick MoS2 films deposited by spin-coating onto Si/SiO2 substrates were studied by means of micro-Raman spectroscopy and Variable Angle Spectroscopic Ellipsometry (VASE).