Visualization of a Buried Organic Interface by Imaging TOF-SIMS and Scanning Auger Microprobe of an Ion Beam Crater Edge.

Abstract : A method has been developed for chemically imaging a buried organic interface of thickness similar to that of a biological conditioning film. Using an ion beam to form a sputter crater, elemental analysis of the edge of the crater is performed using Auger Electron Spectroscopy (AES) and chemical imaging of the edge is performed by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). The crater edge that is formed due to the shape of the ion beam and geometry of the spectrometer has the ability to magnify the interfaces by lOOOx. Samples mimicing titanium bone implant protheses were analyzed to demonstrate the feasibility of the method. jg p.5