Scanning x‐ray fluorescent microanalysis of rock samples

Results are given concerning the two‐dimensional scanning microanalysis of microsections of metallographic specimens of rocks. The monochromatized or white SR beam from a wiggler magnet installed at the electron storage ring VEPP‐3 (2 GeV, 20 kG, 100–200 mA) was used for fluorescence excitation. The working energies ranged from 8 to 35 keV. Without focusing x‐ray optics, the spatial resolution was 60 μm with the monochromatic beam and 30 μm with the white SR beam. The minimum detectable concentration of the elements (within the Fe‐Sr region) is 10 ppm for 1–3 s exposures per point.