Degradation mechanisms studies in CdS/CdTe solar cells with ZnTe:Cu/Au back contact

CdS/CdTe/ZnTe:Cu/Au solar cells were fabricated and tested under stressed conditions including enhanced temperature, forward and reverse bias, open circuit, dark and light. Discussion of results was focused mostly on the development of the back contact Schottky diode (increase in series resistance). Changes in the cell parameters were detected based on the analysis of the dynamic resistance of a cell (dV/dJ) at forward biases. A possible role of electromigration of the Cu dopant was discussed.