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Wide-Field Microscopy Based on Leakage of Plasmon-Coupled Fluorescence
Wide-Field Microscopy Based on Leakage of Plasmon-Coupled Fluorescence
2009
J. Ajimo
S. Frisbie
A. Krishnan
Catherine Chestnutt
Alex A. Bernussi
Luis Grave-de-Peralta
Keywords:
Guided wave testing
Leakage (electronics)
Plasmon
Numerical aperture
Fluorescence
Microscopy
Optics
Materials science
wide field microscopy
Correction
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