Studies on carbon dots embedded Tamm plasmon polariton structures

Tamm plasmon polaritons (TPPs) are excellent candidates for photonic device application for their intriguing properties and simple fabrication design. In this study, optical Tamm structures are fabricated by depositing silver thin film on onedimensional photonic crystals (1DPhCs), constituting twelve pairs of alternating quarter wave thick SiO 2 and TiO 2 thin films. Carbon quantum dots (CQDs) were incorporated in the TiO 2 matrix of the final four pairs of the 1DPhCs. TPPs are observed in the reflectance spectra of the samples with and without CQDs. With the help of transfer matrix method electric field intensity distribution profile is obtained. It is observed that the electric field is confined and enhanced at the metal-1DPhC interface and decays within the 1DPhC. Comparison of PL emission from samples with and without CQDs in the last four layers are presented. Enhanced PL emission from CQDs corresponding to the TPP mode and suppression of emission within the photonic stop band is demonstrated.