Lamellar structure change of waxy corn starch during gelatinization by time-resolved synchrotron SAXS

Abstract In situ experiment of synchrotron small- and wide-angle X-ray scattering (SAXS/WAXS) was used to study the lamellar structure change of starch during gelatinization. Waxy corn starch was used as a model material to exclude the effect of amylose. The thicknesses of crystalline ( d c ), amorphous ( d a ) regions of the lamella and the long period distance ( d ac ) were obtained based on a 1D linear correlation function. The SAXS and WAXS results reveal the multi-stage of gelatinization. Firstly, a preferable increase in the thickness of crystalline lamellae occurs because of the water penetration into the crystalline region. Then, the thickness of amorphous lamellae has a significant increase while that of crystalline lamellae decreases. Next, the thickness of amorphous lamellae starts to decrease probably due to the out-phasing of starch molecules from the lamellae. Finally, the thickness of amorphous lamellae decreases rapidly, with the formation of fractal gel on a larger scale (than that of the lamellae), which gradually decreases as the temperature further increases and is related to the concentration of starch molecular chains. This work system reveals the gelatinization mechanism of waxy corn starch and would be useful in starch amorphous materials processing.