Detection of plasmonic behavior in colloidal indium tin oxide films by impedance spectroscopy

Impedance spectroscopy was conducted on colloidal ITO thin films that had been subjected to alternating oxygen and argon plasma treatments, followed by air annealing from 150 to 750 °C. An equivalent circuit consisting of an RC element nested within another RC element, featuring a negative resistance and a negative capacitance, fitted the data well. These results are interpreted as being due to surface plasmons that are a function of the presence of nanoporous ITO-rich regions surrounded by isolated ITO nanoparticles coated with an amorphous polymer that intertwines with the ITO-rich regions as a function of annealing treatment.