The first light of a single-stage MEMS x-ray optic
2007
The first light of a ultra-lightweight and low-cost micro-pore X-ray optic utilizing MEMS (Micro Electro Mechanical
Systems) technologies is reported. Our idea is to use silicon (111) planes appeared after anisotropic wet
etching of silicon wafers. As a first step to Wolter type-1 optics, a single-stage optic with a focal length of 750
mm and a diameter of 100 mm was designed for energies below 2 keV. The optic consists of 218 mirror chips
for X-ray reflection and an optic mount for packing these chips. Design parameters and required fabrication
accuracies were determined with numerical simulations. The fabricated optic satisfied these accuracies and its
imaging quality was measured at the ISAS X-ray beam line at Al K α 1.49 keV. A focused image was successfully
obtained. The measured image size of ~4 mm was consistent with the chip sizes. The estimated X-ray reflectivity
also could be explained by micro-roughness of less than 3 nm and geometrical occulting effect due to large
obstacle structures on the reflection surface.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
12
References
3
Citations
NaN
KQI