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A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs
A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs
2014
Goichi Ono
Yuki Mori
Michiaki Nakayama
Yusuke Kanno
Keywords:
Parallel computing
Boosting (machine learning)
Electronic engineering
Engineering
Voltage
Static random-access memory
Correction
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