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Defect analysis using a third-generation x-ray microdiffractometer with total reflection capillary x-ray optics
Defect analysis using a third-generation x-ray microdiffractometer with total reflection capillary x-ray optics
1992
Brian R. York
Keywords:
Total internal reflection
X-ray optics
Optics
X-ray
third generation
Materials science
Capillary action
Correction
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