Properties of Fe/MgO (100) nanometric films grown by dc sputtering

Structural and magneto-crystalline properties of Fe nanometric films, grown on MgO (1 0 0) using dc magnetron sputtering, were studied by different experimental techniques. Thickness and surface roughness of the films were investigated by atomic force microscopy, while magneto-crystalline properties were investigated by the magneto-optical Kerr effect and ferromagnetic resonance. Furthermore, the purity degree of the films was investigated by x-ray photoelectron spectroscopy. Our results show that as we increase the deposition temperature, the magneto-crystalline anisotropy of the films also increases, as an indication of a better crystallinity of the samples. The saturation value of the magneto-crystalline anisotropy (550 Oe corresponding to bulk Fe) is reached at deposition temperature of 300 ◦ C.