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內容定址記憶體之三維架構探索與測試 ; Three-Dimensional Architecture Exploration and Testing of Content Addressable Memories
內容定址記憶體之三維架構探索與測試 ; Three-Dimensional Architecture Exploration and Testing of Content Addressable Memories
2010
Yongjun Hu
Yong-Jyun Hu
Keywords:
memory testing
Architecture
Content-addressable memory
test algorithm
Computer science
Computer architecture
Fault model
three dimensional architecture
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