Niko F. van Hulst

University of Twente

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G.J.T. Heesink

Saxion University of Applied Sciences

O.F.J. Noordman

ASML (Netherlands)

B. Bölger

Philips (Spain)

David N. Reinhoudt

University of Twente

E. Kelderman

Vrije Universiteit Amsterdam

Johannes F.J. Engbersen

AIMM Therapeutics (Netherlands)

Willem Verboom

University of Twente

F. B. Segerink

University of Twente

Thomas Faulkner

University of Illinois Urbana-Champaign

Paul Lambeck

University of Twente

Cooperative Institutions

University of Twente

Optical Sciences (United States)

Institute for Atomic and Molecular Physics

Utrecht University

Institute of Photonic Sciences

KU Leuven

Institute of Inorganic Chemistry of the Slovak Academy of Sciences

ASML (Netherlands)

Philips (Netherlands)

Philips (Finland)

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<title>Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope</title>

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1992)

Niko F. van Hulst M.H.P. Moers O.F.J. Noordman Thomas Faulkner F. B. Segerink

Images obtained with a Scanning Near field Optical Microscope (SNOM) operating in reflection are presented.We have obtained the first results with a SiN tip as optical probe.The instrument is simultaneously operated as a Scanning Force Microscope (SFM).Moreover the instrument incorporates an inverted light microscope (LM) for preselection of a scan area.The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fibre probe, which is also presented.The combined microscope is operated either in open loop or as a force regulated SNOM.Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.

Reflection

10.1117/12.58190

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A close look at optical scattering phenomena with PSTM

E. Flück Cédric Peeters L. Kuipers Niko F. van Hulst

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Linear and nonlinear optical properties of substituted pyrrolo[1,2-a]quinolines

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1991)

Niko F. van Hulst G.J.T. Heesink B. Bölger E. Kelderman Willem Verboom

Synthesis and characterization of a class of chiral nonlinear optical organic materials viz. pyrrolo[1 with chiral molecular structure are presented. Both single crystals and crystalline thin films of la have been grown. Structural parameters have been determined by X-ray diffraction. Linear and nonlinear optical properties of the crystals have been analyzed. The transparency range extends into the near-UV-region. The nonlinear coefficients djjk have been measured by second harmonic generation (SHG) using the Makerfringe and phase match techniques.

Characterization

Optical transparency

10.1117/12.24421

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Thin films of calixarenes for quadratic nonlinear optics

Conference on Lasers and Electro-Optics (1993)

G.J.T. Heesink O.F.J. Noordman Niko F. van Hulst B. Bölger E. Kelderman

Organic molecules with π electron systems and asymmetrical charge distribution are interesting tor use in quadratic nonlinear optics. Calix[4]arenes are cyclophanes that consist of four phenol moieties connected by methylene bridges. Functionalization of these phenols allows the combination of four D-π–A units within a single molecule. The increase in the number of D-π-A systems in a calix[4]arene molecule is accompanied by an enhancement of the molecular hyperpolarizability and the dipole moment and by a blue shift of the charge-transfer absorption band. Different substituted calix[4Jarene compounds have been synthesized and examined.

Hyperpolarizability

Calixarene

Chromophore

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ChemInform Abstract: Chiral Pyrrolo(1,2‐a)quinolines as Second‐Order Nonlinear Optical Materials.

ChemInform (1992)

E. Kelderman Willem Verboom Johannes F.J. Engbersen Sybolt Harkema G.J.T. Heesink

Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable via the “References” option.

10.1002/chin.199237209

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<title>Optimization of LPCVD silicon oxynitride growth to large refractive index homogeneity and layer thickness uniformity</title>

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1997)

Kerstin Woerhoff Paul Lambeck H. Albers O.F.J. Noordman Niko F. van Hulst

The thickness non-uniformity and refractive index in- homogeneity of silicon oxynitride thin films, grown by low pressure chemical vapor deposition, have been optimized. The present work was especially motivated by the application of these thin films as well defined waveguides in phase-matched second harmonic generating devices, which are well known for their extremely high requirements to uniformity and homogeneity. However, other demanding integrated optical components like gratings, sensor systems, telecommunication devices, etc., also strongly benefit from highly uniform waveguides.

Silicon oxynitride

10.1117/12.281235

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Calixarenes for nonlinear optics

G.J.T. Heesink O.F.J. Noordman Niko F. van Hulst B. Bölger

Calixarene

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