Currently, in the photovoltaic industry, the market share of n-type monocrystalline silicon is rapidly increasing. However, during mass production, striation defects characterized by concentric circles significantly impact the efficiency of solar cells. In this paper, we investigate the properties and origins of striations in n-type Czochralski silicon solar cells. These striations, occurring in wafers with an oxygen concentration below 7 × 1017 cm−3, are shown to potentially cause an efficiency degradation up to 0.86% absolute. Through an array of techniques, including photoluminescence, optical microscopy (OM), electron beam induced current (EBIC), and Fourier Transform Infrared Spectroscopy, this work demonstrates that such defects primarily form after the thermal treatment processes in the manufacturing of solar cells and indirectly proves that these defects are related to the precipitation behavior of oxygen. Notably, traditional methods of post-polishing and etching followed by OM and EBIC technique failed to detect these defects. Therefore, the indirect characterization methods designed in this study hold significant referential value.
The iron nanoparticles were prepared via a redox reaction between Fe 2+ and BH 4 - in the SDS-ethanol-water system.The iron nanoparticles surface was treated by nickel salt solution. The particles were characterized by the Transmission Electronic Microscope(TEM) and X-Ray Diffraction(XRD).It is shown that γ type iron nanoparticles with a mean size of 50nm have been prepared. The wastewater in the steel plant was treated by the iron nanoparticles. It is shown that suspended substance and concentration of heavy metal ion in wastewater were brought down largely.
Nowadays, a stack of heavily doped polysilicon ( poly ‐Si) and tunnel oxide (SiO x ) is widely employed to improve the passivation performance in n ‐type tunnel oxide passivated contact (TOPCon) silicon solar cells. In this case, it is critical to develop an in‐line advanced fabrication process capable of producing high‐quality tunnel SiO x . Herein, an in‐line ozone‐gas oxidation (OGO) process to prepare the tunnel SiO x is proposed to be applied in n ‐type TOPCon solar cell fabrication, which has obtained better performance compared with previously reported in‐line plasma‐assisted N 2 O oxidation (PANO) process. In order to explore the underlying mechanism, the electrical properties of the OGO and PANO tunnel SiO x are analyzed by deep‐level transient spectroscopy technology. Notably, continuous interface states in the band gap are detected for OGO tunnel SiO x , with the interface state densities ( D it ) of 1.2 × 10 12 –3.6 × 10 12 cm −2 eV −1 distributed in E v + (0.15–0.40) eV, which is significantly lower than PANO tunnel SiO x . Furthermore, X‐ray photoelectron spectroscopy analysis indicate that the percentage of SiO 2 (Si 4+ ) in OGO tunnel SiO x is higher than which in PANO tunnel SiO x . Therefore, we ascribe the lower D it to the good inhibitory effects on the formation of low‐valent silicon oxides during the OGO process. In a nutshell, OGO tunnel SiO x has a great potential to be applied in n ‐type TOPCon silicon solar cell, which may be available for global photovoltaics industry.
Abstract Although pursuing fun seems contradictory to work, it may yield beneficial outcomes for not only employees but also leaders in the workplace. The present paper aims to bridge the gap between the workplace fun/play literature and leadership research by introducing the concept of leader fun pursuit and examining its influence on followers' evaluations. Moreover, drawing on the dual perspective model of social evaluation and expectancy violation theory, we examine the effects of leader fun pursuit on followers' perceptions of leader attributes and evaluations of leadership, and posit a gender‐contingent boundary condition. We conducted three studies to develop a scale and examine our hypotheses. Study 1 (four samples, total N = 734) developed a four‐item scale to measure leader fun pursuit and established its reliability and validity. Study 2 ( N = 309) used a multi‐wave design to examine the full model. Study 3 ( N = 279) used a vignette‐based experiment to strengthen the internal validity of our conceptual model. We found that leader fun pursuit generally enhances followers' evaluations of the leader, and this effect was especially pronounced for female leaders. Overall, we introduce a novel approach to effective leadership and examine the gender differences therein.
Mathematical models for the calculation of sidewall
surface roughness have been developed for focused ion
beam (FIB) sputtering. The surface roughness profile
at the sidewall was different to the bottom surface
profile for the same sputtering parameters and substrate
material. The cumulative sputtering by the
Gaussian beam creates a steady state surface profile
at the sidewall which has been used to develop surface
roughness models. The ion intensity distribution profile
was considered to be Gaussian. The beam function
includes ion type, ion acceleration voltage, beam radius,
tailing and neighbouring of the successive beams.
Knowing the beam radius and pixel spacing, sidewall
surface roughness of FIB sputtered microfeatures can be
calculated using these models. The substrate material
function has no direct effect on the sidewall surface
profile if the same material is used for the study of beam
profile and fabrication of microfeatures.
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