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Jos Dohmen
Jos Dohmen
NXP Semiconductors
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Defect Oriented Testing for analog/mixed-signal devices
2011
ITC | International Test Conference
Bram Kruseman
Bratislav Tasić
Camelia Hora
Jos Dohmen
Hamidreza Hashempour
Maikel van Beurden
Yizi Xing
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