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W. A. Kolasinski

Space Sciences Laboratory

21

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Effects of heavy ions on microcircuits in space: Recently investigated upset mechanisms

1988
- R. Koga
- W. A. Kolasinski
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Effects of Heavy Ions on Microcircuits in Space: Recently Investigated Upset Mechanisms

1987 IEEE Transactions on Nuclear Science
- R. Koga
- W. A. Kolasinski
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SEU (Single Event Upset) Tolerance of McDonnell Douglas' CMOS/SOS High Performance 3 Chip Implementation of MIL-STD-1750A Instruction Set.

1986
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SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986
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Comparison of Soft Errors Induced by Heavy Ions and Protons

1986 IEEE Transactions on Nuclear Science
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Heavy ion induced upsets in semiconductor devices

1986
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SEU Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors

1985 IEEE Transactions on Nuclear Science
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Cosmic ray simulation and testing program. Final Report, January-November 1984

1985
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Techniques of Microprocessor Testing and SEU-Rate Prediction

1985 IEEE Transactions on Nuclear Science
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Heavy Ion Induced Upsets in Semiconductor Devices

1985 IEEE Transactions on Nuclear Science
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