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T. Takeyama
T. Takeyama
Nagoya University
Voltage
Microscopy
Kelvin probe force microscope
Analytical chemistry
Electronic engineering
2
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14
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Potential profile measurement of GaAs MESFETs passivated with low-temperature grown GaAs layer by Kelvin probe force microscopy
1999
Solid-state Electronics
K. Matsunami
T. Takeyama
Takao Usunami
S. Kishimoto
Koichi Maezawa
T. Mizutani
Masaaki Tomizawa
P. Schmid
K.M. Lipka
E. Kohn
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Citations (13)
Observation of high field regions in GaAs MESFETs by using Kelvin probe force microscopy
1999
IPRM | International Conference on Indium Phosphide and Related Materials
T. Mizutani
T. Takeyama
K. Matsunami
S. Kishimoto
Koichi Maezawa
Masaaki Tomizawa
P. Schmid
K.M. Lipka
E. Kohn
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Citations (1)
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