Old Web
English
Sign In
Acemap
>
authorDetail
>
Remi Le Tiec
Remi Le Tiec
Applied Materials
Materials science
Metrology
Experimental data
Residual
Computer vision
2
Papers
1
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Advanced roughness characterization for 300mm Si photonics patterning and optimization
2021
Remi Le Tiec
Shimon Levi
Angela Kravtsov
Olga Novak
Cecilia Dupré
Cyril Vannuffel
Tristan Dewolf
Stephanie Garcia
Quentin Wilmart
Jonathan Faugier-Tovar
Show All
Source
Cite
Save
Citations (1)
DSA process characterization using BSE metrology (Conference Presentation)
2018
Remi Le Tiec
Shimon Levi
Ahmed Gharbi
Maxime Argoud
Raluca Tiron
G. Chamiot-Maitral
Stephane Rey
Show All
Source
Cite
Save
Citations (0)
1