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Ming-Jaan Wang

National Taipei University of Technology

3

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130

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Using EWMA control schemes for monitoring wafer quality in negative binomial process

2011 Microelectronics Reliability
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Simulated annealing based parallel genetic algorithm for facility layout problem

2011 International Journal of Production Research
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A solution to the unequal area facilities layout problem by genetic algorithm

2005 Computers in Industry
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