Old Web
English
Sign In
Acemap
>
authorDetail
>
Yoshiharu Mori
Yoshiharu Mori
Mitsubishi Heavy Industries
Static random-access memory
Electronic engineering
Physics
Voltage
Electronic circuit
2
Papers
8
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Data Retention Voltage Based Analysis of Systematic Variations in SRAM SEU Hardness: A Possible Solution to Synergistic Effects of TID
2019
IEEE Transactions on Nuclear Science
Daisuke Kobayashi
Yoshiharu Mori
Daisuke Matsuura
Masaki Kusano
Takanori Narita
Shigeru Ishii
Kazuyuki Hirose
Keita Sakamoto
Shogo Okamoto
Shunsuke Baba
Hiroyuki Shindou
Osamu Kawasaki
Takahiro Makino
Takeshi Ohshima
Show All
Source
Cite
Save
Citations (2)
Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage
2019
IEEE Transactions on Nuclear Science
Daisuke Kobayashi
Naoki Hayashi
Kazuyuki Hirose
Yuya Kakehashi
Osamu Kawasaki
Takahiro Makino
Takeshi Ohshima
Daisuke Matsuura
Yoshiharu Mori
Masaki Kusano
Takanori Narita
S. Ishii
Kazunori Masukawa
Show All
Source
Cite
Save
Citations (6)
1